Supercharging Correlative Microscopy
Equipping scanning electron microscopes with Raman imaging to create a 2014 Innovation Award-winning universal microscopy solution.
Olaf Hollricher |
Efforts to combine different high-resolution imaging techniques to provide the most comprehensive material property characterization are on the increase. For example, it is possible to show the structure of a sample with scanning electron microscopy (SEM) and determine its molecular composition with a Raman microscope. As these methods require separate instruments, an inevitable complication is sample transfer and re-identification of the investigated area. Is there a way to dispense with this tedious procedure and replace it with a simple – ideally, one-click – operation?
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