Screening for Surface Contaminants Using IR Imaging (QCL)
contributed by Bruker |
The quality requirements for precision mechanics are enormous. They are often part of complex assemblies, that require a large number of very special components. If one of these components carries a critical impurity, the entire assembly is in danger. Here, FT-IR microscopy is a proven method to locate and identify unknown substances and contaminants based on their molecular vibration. This kind of analysis provides reliable, unambiguous indications of where a contamination is coming from and how to troubleshoot processes.
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