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The Analytical Scientist / App Notes / 2023 / Syft Tracer™: Next Generation Volatile Impurities Analysis

Syft Tracer™: Next Generation Volatile Impurities Analysis

03/16/2023

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Syft Tracer™ is the latest advancement in selected ion flow tube mass spectrometry (SIFT-MS) technology, delivering even greater stability and reproducibility. For these reasons, together with enhanced sensitivity, this next-generation instrument revolutionizes workflows. This application note describes the benefits that Syft Tracer™ brings to analysis of formaldehyde in a polyethylene glycol (PEG) excipient (Gelucire 44/14). Syft Tracer™ quantifies formaldehyde directly from the polymer headspace without dissolution and eliminates the derivatization step required by chromatographic analyses. Stable quantitation of formaldehyde is demonstrated for almost one month, enabling sample throughputs of over 220 samples/day to be achieved by reducing the calibration frequency. Additionally, Syft Tracer™ is four-fold faster reporting the first result than chromatography-based analyses. 


Maximizing sample throughput and minimizing the time to report analytical results are key efficiency metrics in routine testing laboratories, while also acting as important enablers in research and development. Conventional chromatographic techniques have limitations on analysis times imposed by the chromatographic separation process. Furthermore, set-up times for analysis can be long, since in addition to sample preparation (which may include sample drying or derivatization) there is also significant time devoted to analysis of calibration standards. Additionally, changing between methods on chromatographic systems may require hardware configuration changes (for example, change of inlet liner or column).

>> Download the Application Note as a PDF

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