Conexiant
Login
  • The Analytical Scientist
  • The Cannabis Scientist
  • The Medicine Maker
  • The Ophthalmologist
  • The Pathologist
  • The Traditional Scientist
The Analytical Scientist
  • Explore

    Explore

    • Latest
    • News & Research
    • Trends & Challenges
    • Keynote Interviews
    • Opinion & Personal Narratives
    • Product Profiles
    • App Notes

    Featured Topics

    • Mass Spectrometry
    • Chromatography
    • Spectroscopy

    Issues

    • Latest Issue
    • Archive
  • Topics

    Techniques & Tools

    • Mass Spectrometry
    • Chromatography
    • Spectroscopy
    • Microscopy
    • Sensors
    • Data & AI

    • View All Topics

    Applications & Fields

    • Clinical
    • Environmental
    • Food, Beverage & Agriculture
    • Pharma & Biopharma
    • Omics
    • Forensics
  • People & Profiles

    People & Profiles

    • Power List
    • Voices in the Community
    • Sitting Down With
    • Authors & Contributors
  • Business & Education

    Business & Education

    • Innovation
    • Business & Entrepreneurship
    • Career Pathways
  • Events
    • Live Events
    • Webinars
  • Multimedia
    • Video
Subscribe
Subscribe

False

The Analytical Scientist / Authors / Matthieu Chausseau

Matthieu Chausseau

Matthieu Chausseau obtained his PhD in Analytical Chemistry at the University of Lyon (France) in 2001 where his work was mainly focused on elemental analysis. From 2001 to 2007, he worked as application scientist for Varian Inc. in France, specializing in ICP-OES and AAS. In 2008, he started at HORIBA Scientific in France as ICP-OES Product Manager for the Center of Excellence. In 2015 he was appointed Application Manager for France, handling responsibilities for ICP-OES, GD-OES, Elemental Analyzers, Ellipsometry, Fluorescence and Raman instruments and working to promote global solutions to customers. He joined HORIBA Scientific in USA in July 2016 as Product Manager for ICP-OES, GD, Elemental Analyzers and Ellipsometry.

  • Contributions
Fields & Applications Spectroscopy

Depth Profiling with GD-OES

December 7, 2016

Glow discharge optical emission spectrometry (GDOES) is now able to shed light on layer thickness thanks to differential interferometry profiling (DiP).

1 min read

Depth Profiling with GD-OES

Newsletters

Receive the latest pathology news, personalities, education, and career development – weekly to your inbox.

Newsletter Signup Image

False

Advertisement

Recommended

False

False

The Analytical Scientist
Subscribe

About

  • About Us
  • Work at Conexiant Europe
  • Terms and Conditions
  • Privacy Policy
  • Advertise With Us
  • Contact Us

Copyright © 2025 Texere Publishing Limited (trading as Conexiant), with registered number 08113419 whose registered office is at Booths No. 1, Booths Park, Chelford Road, Knutsford, England, WA16 8GS.