Innovations in Characterization Across Scientific Frontiers: Advancing Structural and Chemical Analysis Technologies
Advance measurement capabilities, accelerate sample throughput, and unlock full performance for your R&D application
Using cutting-edge characterization tools provides a competitive advantage in a research field or R&D project. By combining various analysis or imaging techniques in one instrument, scientists can achieve faster and more comprehensive insights into their samples. With a portfolio of high-end confocal, structural imaging, and spectroscopic characterization devices, Oxford Instruments is your one-stop shop and expert partner, supporting you in setting the benchmark in your field of application.
Benchtop confocal microscopy for Life Science and biomedical applications
BC43 is a push-button imaging solution designed with cost, performance, and accessibility in mind. Make stunning 2D and 3D images part of your routine benchtop workflow. The BC43 Benchtop imaging system is fast and easy to learn: Take great images sooner with less need for support. New BC43 models can be upgraded as your needs grow.
Download E-bookRaman Microscopy for 3D Chemical and Materials Analyses
Oxford Instruments’ confocal Raman imaging microscopes deliver advanced chemical characterization with industry-leading speed, sensitivity and resolution – simultaneously. The alpha300 series includes variations for every budget, and every environment and sample type, enabling 3D mapping of the distribution of the chemical compounds in a sample. Fields of application include: Life Sciences, Pharmaceutical Research, and Geosciences.
Download Application NoteDetectors for EM: EDS and BEX
Used on electron microscopes (SEM and TEM) and ion-beam systems (FIB), our tools support R&D across a wide range of academic and industrial applications. Our unique detectors enable EDS data collection to analyze nanomaterials and surfaces at the highest SEM resolution with maximum sensitivity. The new Backscattered Electron and X-ray (BEX) Imaging detector seamlessly combines backscattered electron and X-ray signals to deliver rapid, high-definition color images embedded with elemental data as you navigate your sample.
Download Application NoteRaman Imaging and Scanning Electron (RISE) Microscopy
RISE Microscopy is a novel correlative microscopy technique that combines SEM and confocal Raman Imaging. Through RISE Microscopy, ultra-structural surface properties can be linked to molecular compound information. When combined with energy-dispersive X-ray spectroscopy (EDS), it offers comprehensive sample characterization at the nanoscale.
Download BrochureNanoindentation and Mechanical Microscopy
With nanoindentation, the mechanical properties of intricate microstructures can be imaged for materials research and semiconductor applications. It allows you to visualize variations in mechanical properties or quantify the fracture toughness of specific regions or interfaces.
Download Application NoteBenchtop NMR Spectroscopy
X-Pulse 90 is a revolutionary new benchtop nuclear magnetic resonance (NMR) spectrometer that brings broadband NMR to the benchtop at 90 MHz for the first time. X-Pulse 90 is the ideal instrument for flexible chemical analysis, across a wide variety of applications, as it enables investigation of the largest number of nuclei without compromising performance.
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