XperRAM S, a Nanobase’s best-selling Raman microscope system, is built with a versatile set of a transmission spectrometer and a high-performance detector that provides a high peak efficiency and a high signal-to-noise ratio for a wide range of wavelengths covering 405, 532, 633, and 785 nm (1064 nm also available through customization).
Not only that, XperRAM S also offers a wider mapping experience with 200 µm x 200 µm scanning area on 40X objective.
The modular concept of XperRAM S enables easy customization such as system modification and system integration with other instruments or devices.
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