Topographic Raman Imaging began with WITec’s TrueSurface Microscopy. It uses an optical profilometer to trace a sample’s surface to ensure the Raman measurement maintains optimum focus. Any variation in humidity or temperature occurring during measurements with long integration times is immediately compensated for, resulting in perfectly sharp and detailed images. Both the profilometry and Raman measurements are acquired through one beampath for one-pass operation, enabling quick 3D molecular characterization on rough or inclined samples with minimal, if any, sample preparation. Investigations on pharmaceutical tablet coatings, geological samples, composite emulsions, semiconductors and many other applications can benefit from TrueSurface.
