Fields & Applications Polymers, Mass Spectrometry

Continuous Headspace Analysis Using SIFT-MS: A Powerful Probe of Dynamic Processes

contributed by Syft Technologies | 11/14/2017

Mark J. Perkins,¹ Vaughan S. Langford²

¹Anatune Ltd, Girton Road, Cambridge, CB3 0NA, United Kingdom \ ²Syft Technologies Ltd, 3 Craft Place, Christchurch 8024, New Zealand

This application note introduces the continuous headspace analysis (CHA) technique, which revolutionizes investigation of dynamic processes. By applying direct analysis using selected ion flow tube mass spectrometry (SIFT-MS), continuous, real-time monitoring of volatile emissions from diverse industrial and consumer products is simple.

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