Perkin Elmer

This work demonstrates the ability of the NexION 2000 ICP-MS with Syngistix Nano Software Module to accurately measure NPs.

This paper demonstrates the ability of the NexION 2000 ICP-MS to accurately measure trace levels in semiconductor-grade hydrochloric acid.

This work demonstrates the ability of the NexION 2000 ICP-MS to successfully measure Class 1 and 2A elemental impurities in antacids.

This paper demonstrates the ability of the NexION 2000 ICP-MS to successfully analyze a large number of elements in various forms of milk.

During the last decade, the production and use of engineered nanomaterials (ENMs) have experienced a drastic increase, resulting in a potential risk of their release into the environment. Therefore, the study of their impact on the environment becomes crucial.

This study outlines the quantitation and characterization of element oxide nanoparticles (Al2O3, and CeO2) commonly used in the nanoelectronics and semiconductor fabrication industry for the chemical-mechanical planarization (CMP) of semiconductor surfaces.

With the increasing interest in nanoparticles, various ways of detecting and measuring them are being used.

Nanotechnology is an emerging and rapidly growing field whose dynamics and prospects pose many great challenges to scientists and engineers

Recent studies have shown that some nanoparticles may be harmful to humans.

The advancement of the single particle ICP-MS (SP-ICP-MS) technique is a great benefit for the study of ENPs in natural systems at environmentally relevant (ng/L) concentrations.